[3]
J.-Y. Moon*, K.-H. Park*, Jung Uk Kim†, and G.-M. Park† "Online Class Incremental Learning on Stochastic Blurry Task Boundary via Mask and Visual Prompt Tuning" International Conference on Computer Vision (ICCV), Paris, France, Oct. 2023.
[2]
J. Seo*, Ji-Su Kang*, and G.-M. Park "LFS-GAN: Lifelong Few-Shot Image Generation" International Conference on Computer Vision (ICCV), Paris, France, Oct. 2023.
[1]
Yong Hyun Ahn, G.-M. Park†, and Seong Tae Kim† "LINe: Out-of-Distribution Detection by Leveraging Important Neurons" Computer Vision and Pattern Recognition (CVPR), Vancouver, Canada, Jun. 2023.
[1]
A.-H. Shin, Seong Tae Kim†, and G.-M. Park† "Time Series Anomaly Detection using Transformer-based GAN with Two-Step Masking" IEEE Access, vol.11, no.1, pp. 74035-74047, Jul. 2023.
[3]
Cherrie Kim, Seonguk Kim, Jae-Woo Choi and G.-M. Park "Enhanced Backchannel Prediction Model Using Transformer and Loss Improvement" Korea Software Congress (KSC), Busan, Republic of Korea, Dec. 2023.
[2]
M.-J. Kim, J.-Y. Moon and G.-M. Park "Backchannel Prediction Model using Prototype Prompting" Korea Software Congress (KSC), Busan, Republic of Korea, Dec. 2023.
[1]
S.-H. Lee, T.-Y. Lee and G.-M. Park "OutLaST: Out-of-Distribution-based Continual Learning via Sample Selection and Task Prediction" Korea Software Congress (KSC), Busan, Republic of Korea, Dec. 2023.
[4]
G.-M. Park, J.-Y. Moon, and K.-H. Park "인공지능 기반 분류 모델의 온라인 점진 학습 방법 및 이를 수행하기 위한 컴퓨팅 장치 (Online Incremental Learning Method of Artificial Intelligence-based Classification Model and Computing Device for Performing the Same)" Korean Patent Application (10-2023-0145630), Oct. 27, 2023.
[3]
G.-M. Park, A.-H. Shin, and M.-Y. Park "학습 가능한 이상치 모방을 통한 다변량 시계열 데이터 이상치 탐지 장치 및 방법 (Apparatus and Method for Detecting of Multivariate Time-series Anomaly)" Korean Patent Application (10-2023-0145316), Oct. 27, 2023.
[2]
G.-M. Park and K.-H. Park "소수 샷 연속 학습 방법 및 이를 수행하기 위한 컴퓨팅 장치 (Few Shot Continuous Learning Method and Computing Device for Executing the Same)" Korean Patent Application (10-2023-0145315), Oct. 27, 2023.
[1]
G.-M. Park and A.-H. Shin "다변량 시계열 데이터의 이상치 탐지 방법 및 이를 수행하기 위한 컴퓨팅 장치 (Method for Detecting Anomaly in Time Series Data and Computing Device for Performing the Same)" Korean Patent Application (10-2023-0051450), Apr. 19, 2023.